Analog and Mixed-Signal Boundary-Scan

Analog and Mixed-Signal Boundary-Scan

Author: Adam Osseiran

Publisher: Springer Science & Business Media

ISBN: 9781475744996

Category: Technology & Engineering

Page: 156

View: 179

This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.
Analog and Mixed-Signal Boundary-Scan
Language: en
Pages: 156
Authors: Adam Osseiran
Categories: Technology & Engineering
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media

This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Language: en
Pages: 690
Authors: M. Bushnell, Vishwani Agrawal
Categories: Technology & Engineering
Type: BOOK - Published: 2004-12-15 - Publisher: Springer Science & Business Media

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a
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Language: en
Pages: 808
Authors: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Categories: Technology & Engineering
Type: BOOK - Published: 2006-08-14 - Publisher: Elsevier

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly
Boundary-Scan Interconnect Diagnosis
Language: en
Pages: 168
Authors: José T. de Sousa, Peter Y.K. Cheung
Categories: Technology & Engineering
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media

This pioneering text explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. It takes a new approach, carefully modelling circuit and interconnect faults, and applying graph techniques to solve problems.
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Language: en
Pages: 298
Authors: Jose Luis Huertas Díaz
Categories: Technology & Engineering
Type: BOOK - Published: 2010-02-23 - Publisher: Springer Science & Business Media

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in